Impact of different annealing conditions on physical properties of ZnSe thin films for ecofriendly buffer layer applications

dc.contributor.authorChander, S.
dc.date.accessioned2020-12-18T06:00:44Z
dc.date.available2020-12-18T06:00:44Z
dc.date.issued2020
dc.descriptionOnly IISERM authors are available in the record.
dc.description.abstractIn Cd-based and CIGS solar cells, the CdS is used as optical window to ensure maximum transmittance of the incident irradiance towards absorber-layer while Cadmium free viable alternative is required to replace toxic CdS layer. Herein, ZnSe films of thickness 200 nm were prepared by electron-beam evaporation followed by annealing in air ambient and vacuum within temperature range 100−300 °C and then subjected to various characterization tools to optimize physical properties for buffer layer applications. The structural properties demonstrate Zinc blende cubic structure with preferred reflection corresponding to (111) plane. The optical properties reveal to high transmittance in visible and nearly IR regions and direct energy band-gap is estimated within 2.53–2.65 eV range. The surface morphology indicates uniform deposition with grain-growth, EDS analysis confirms deposition of films and current-voltage relation indicates ohmic behavior. The findings warrant for applying films air annealed at 300 °C as potential buffer-layer in solar cellsen_US
dc.identifier.citationMaterials Research Bulletin, 132en_US
dc.identifier.other10.1016/j.materresbull.2020.110982
dc.identifier.urihttps://www.sciencedirect.com/science/article/abs/pii/S002554082031463X?dgcid=rss_sd_all
dc.identifier.urihttp://hdl.handle.net/123456789/3205
dc.language.isoen_USen_US
dc.publisherElsevier Ltden_US
dc.subjectAir-annealingen_US
dc.subjectBuffer-layeren_US
dc.subjectMicrostructural and optoelectrical propertiesen_US
dc.subjectPhysical vapor depositionen_US
dc.titleImpact of different annealing conditions on physical properties of ZnSe thin films for ecofriendly buffer layer applicationsen_US
dc.typeArticleen_US

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