The pressure- enhanced superconducting phase of Sr x –Bi 2 Se 3 probed by hard point contact spectroscopy.

dc.contributor.authorKumar, Ritesh
dc.contributor.authorVasdev, Aastha
dc.contributor.authorDas, Shekhar
dc.contributor.authorHowlader, Sandeep
dc.contributor.authorSheet, Goutam
dc.date.accessioned2023-08-25T18:40:28Z
dc.date.available2023-08-25T18:40:28Z
dc.date.issued2021
dc.descriptionOnly IISER Mohali authors are available in the record.en_US
dc.description.abstractThe superconducting systems emerging from topological insulators upon metal ion intercalation or application of high pressure are ideal for investigation of possible topological superconductivity. In this context, Sr-intercalated Bi2Se3 is specially interesting because it displays pressure induced re-entrant superconductivity where the high pressure phase shows almost two times higher Tc than the ambient superconducting phase ( TC∼2.9 K). Interestingly, unlike the ambient phase, the pressure-induced superconducting phase shows strong indication of unconventional superconductivity. However, since the pressure-induced phase remains inaccessible to spectroscopic techniques, the detailed study of the phase remained an unattained goal. Here we show that the high-pressure phase can be realized under a mesoscopic point contact, where transport spectroscopy can be used to probe the spectroscopic properties of the pressure-induced phase. We find that the point contact junctions on the high-pressure phase show unusual response to magnetic field supporting the possibility of unconventional superconductivity.en_US
dc.identifier.citationScientific Reports, 11(1).en_US
dc.identifier.urihttps://doi.org/10.1038/s41598-021-83411-w
dc.identifier.urihttp://hdl.handle.net/123456789/5183
dc.language.isoen_USen_US
dc.publisherSpringer Natureen_US
dc.subjectPhase transitionsen_US
dc.subjectTopological insulatorsen_US
dc.subjectcritical phenomena Superconducting propertiesen_US
dc.titleThe pressure- enhanced superconducting phase of Sr x –Bi 2 Se 3 probed by hard point contact spectroscopy.en_US
dc.typeArticleen_US

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