Attosecond stable dispersion-free delay line for easy ultrafast metrology
| dc.contributor.author | Tyagi, Akansha | |
| dc.contributor.author | Sidhu, Mehra S. | |
| dc.contributor.author | Mandal, Ankur | |
| dc.contributor.author | Kapoor, Sanjay | |
| dc.contributor.author | Dahiya, Sunil | |
| dc.contributor.author | Rost, Jan M. | |
| dc.contributor.author | Pfeifer, Thomas | |
| dc.contributor.author | Singh, Kamal P. | |
| dc.date.accessioned | 2023-08-09T04:57:55Z | |
| dc.date.available | 2023-08-09T04:57:55Z | |
| dc.date.issued | 2022 | |
| dc.description | Only IISER Mohali authors are available in the record. | en_US |
| dc.description.abstract | We demonstrate a dispersion-free wavefront splitting attosecond resolved interferometric delay line for easy ultrafast metrology of broadband femtosecond pulses. Using a pair of knife-edge prisms, we symmetrically split and later recombine the two wavefronts with a few tens of attosecond resolution and stability and employ a single-pixel analysis of interference fringes with good contrast using a phone camera without any iris or nonlinear detector. Our all-reflective delay line is theoretically analyzed and experimentally validated by measuring 1st and 2nd order autocorrelations and the SHG-FROG trace of a NIR femtosecond pulse. Our setup is compact, offers attosecond stability with flexibility for independent beam-shaping of the two arms. Furthermore, we suggest that our compact and in-line setup can be employed for attosecond resolved pump-probe experiments of matter with few-cycle pulses. | en_US |
| dc.identifier.citation | Scientific Reports, 12(1), 8525. | en_US |
| dc.identifier.uri | https://doi.org/10.1038/s41598-022-12348-5 | |
| dc.identifier.uri | http://hdl.handle.net/123456789/4408 | |
| dc.language.iso | en_US | en_US |
| dc.publisher | Scientific Reports | en_US |
| dc.subject | Attosecond | en_US |
| dc.subject | Dispersion-free | en_US |
| dc.subject | Ultrafast metrology | en_US |
| dc.title | Attosecond stable dispersion-free delay line for easy ultrafast metrology | en_US |
| dc.type | Article | en_US |