Experimental demonstration of optimized quantum process tomography on the IBM quantum experience

dc.contributor.authorGaikwad, Akshay
dc.contributor.authorShende, Krishna
dc.contributor.authorDorai, Kavita
dc.date.accessioned2023-08-12T19:26:41Z
dc.date.available2023-08-12T19:26:41Z
dc.date.issued2021
dc.descriptionOnly IISERM authors are available in the record.en_US
dc.description.abstractWe experimentally performed complete and optimized quantum process tomography of quantum gates implemented on superconducting qubit-based IBM QX2 quantum processor via two constrained convex optimization (CCO) techniques: least squares optimization and compressed sensing optimization. We studied the performance of these methods by comparing the experimental complexity involved and the experimental fidelities obtained. We experimentally characterized several two-qubit quantum gates: identity gate, a controlled-NOT gate, and a SWAP gate. The general quantum circuit is efficient in the sense that the data needed to perform CCO-based process tomography can be directly acquired by measuring only a single qubit. The quantum circuit can be extended to higher dimensions and is also valid for other experimental platforms.en_US
dc.identifier.citationInternational Journal of Quantum Information, 19(7).en_US
dc.identifier.urihttps://doi.org/10.1142/S0219749920400043
dc.identifier.urihttp://hdl.handle.net/123456789/4662
dc.language.isoen_USen_US
dc.publisherWorld Scientificen_US
dc.subjectExperimentalen_US
dc.subjectdemonstrationen_US
dc.subjectoptimizeden_US
dc.subjectquantumen_US
dc.titleExperimental demonstration of optimized quantum process tomography on the IBM quantum experienceen_US
dc.typeArticleen_US

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