Please use this identifier to cite or link to this item: http://hdl.handle.net/123456789/1984
Full metadata record
DC FieldValueLanguage
dc.contributor.authorDe, A.K.-
dc.date.accessioned2020-11-20T09:15:42Z-
dc.date.available2020-11-20T09:15:42Z-
dc.date.issued2017-
dc.identifier.citationJournal of Optics (United Kingdom), 19 (6)en_US
dc.identifier.other10.1088/2040-8986/aa698c-
dc.identifier.urihttps://iopscience.iop.org/article/10.1088/2040-8986/aa698c-
dc.identifier.urihttp://hdl.handle.net/123456789/1984-
dc.descriptionOnly IISERM authors are available in the record.-
dc.description.abstractStable trapping of individual dielectric nanoparticles under high-repetition-rate ultrafast pulsed excitation has been demonstrated and theoretically explained based on repetitive instantaneous trapping as well as optical nonlinearity assisted trapping. Here we estimate the force exerted on a micron-sized spherical dielectric particle including optical Kerr effect. Using geometric optics approximation, we show how inclusion of optical Kerr effect results in significant change of the force curves along axial direction under femtosecond pulsed excitation compared with continuous-wave excitation. The results show excellent agreement with previous experimental findings. Most importantly, similar to the optical trapping of nanoparticles under ultrafast pulsed excitation, we show that the efficiency of trapping of micron-sized particles is also governed by the barrier height (and not the absolute depth) of the axial trapping potential.en_US
dc.language.isoen_USen_US
dc.publisherIOP Publishing Ltden_US
dc.subjectoptical Kerren_US
dc.subjectfemtosecond laseren_US
dc.subjectdielectric microspheresen_US
dc.titleTheoretical investigation on optical Kerr effect in femtosecond laser trapping of dielectric microspheresen_US
dc.typeArticleen_US
Appears in Collections:Research Articles

Files in This Item:
File Description SizeFormat 
Need to add pdf.odt8.63 kBOpenDocument TextView/Open


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.