Please use this identifier to cite or link to this item: http://hdl.handle.net/123456789/2956
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dc.contributor.authorVerma, Gopal-
dc.contributor.authorSingh, K.P.-
dc.date.accessioned2020-12-10T07:09:00Z-
dc.date.available2020-12-10T07:09:00Z-
dc.date.issued2014-
dc.identifier.citationApplied Physics Letters,104(24)en_US
dc.identifier.otherhttps://doi.org/10.1063/1.4884515-
dc.identifier.urihttps://aip.scitation.org/doi/10.1063/1.4884515-
dc.identifier.urihttp://hdl.handle.net/123456789/2956-
dc.description.abstractWe report a simple optical technique to measure time-resolved nanoscale surface profile of an evaporating sessile fluid droplet. By analyzing the high contrast Newton-ring like dynamical fringes formed by interfering Fresnel reflections, we demonstrated λ/100≈ 5 nm sensitivity in surface height (at 0.01-160 nm/s rate) of an evaporating water drop. The remarkably high sensitivity allowed us to precisely measure its transient surface dynamics during contact-line slips, weak perturbations on the evaporation due to external magnetic field and partial confinement of the drop. Further, we measured evaporation dynamics of a sessile water drop on soft deformable surface to demonstrate wide applicability of this technique.en_US
dc.language.isoenen_US
dc.publisherAmerican Institute of Physicsen_US
dc.subjectNanoscaleen_US
dc.subjectTime-resolved interferenceen_US
dc.subjectDynamicsen_US
dc.titleTime-resolved interference unveils nanoscale surface dynamics in evaporating sessile dropleten_US
dc.typeArticleen_US
Appears in Collections:Research Articles

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