Please use this identifier to cite or link to this item: http://hdl.handle.net/123456789/991
Full metadata record
DC FieldValueLanguage
dc.contributor.authorMancheykhun, Taseng-
dc.date.accessioned2018-09-04T16:56:28Z-
dc.date.available2018-09-04T16:56:28Z-
dc.date.issued2018-09-04-
dc.identifier.urihttp://hdl.handle.net/123456789/991-
dc.description.abstract1/f noise has been observed in almost every material. It is the least understood type of noise. There is no general model and theory that explains 1/f noise in different materials, although there are models that describe certain observations or measure- ments in specific materials. In this project, I have tried to experimentally measure 1/f noise in resistors like metal film resistor and wire-wound resistor, using wheatstone bridge implementation and 0-90 o subtraction technique. I have shown the measure- ment improvement of the experimental setup with wheatstone bridge implementation for frequency as low as 15mHz as compared to measurement using four-probe and OFFSET feature of the lock-in amplifier.en_US
dc.description.sponsorshipIISERMen_US
dc.language.isoenen_US
dc.publisherIISERMen_US
dc.subjectOptimizationen_US
dc.subjectTypes of noiseen_US
dc.subjectMeasurement setup and apparatusen_US
dc.subjectSample Preparationen_US
dc.titleOptimization of 1/f noise measurement setupen_US
dc.typeThesisen_US
dc.guideVenkatesan, A.-
Appears in Collections:MS-13

Files in This Item:
File Description SizeFormat 
MS13086.pdf38.73 MBAdobe PDFView/Open


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.